장비검색/예약
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정보제공 : ZEUS 장비활용종합포털(www.zeus.go.kr)
B1500A 반도체 디바이스 분석기
B1500A Semiconductor Device Parameter Analyzer
| GBTP No. | - |
|---|---|
| NFEC등록번호 | NFEC-2022-05-278852 |
| I-tube등록번호 | 2201-C-0268 |
| 보유기관 | 금오공과대학교 산학협력단 |
| 연락처 | 054-478-6783 |
장비정보
| 모델명 | B1500A | 제작사 | Keysight Technologies |
|---|---|---|---|
| 취득일자 | 2022-01-27 | 취득금액 | 149,628,250원 |
| 표준분류 | 전기/전자장비 > 측정시험장비 > 광/LED/반도체/디스플레이측정시험장비 | 활용용도 | 시험 |
| 장비위치 |
경상북도 구미시 대학로 61 금오공과대학교 공동실험실습관 F4층 408호
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| 장비설명 |
- Precision voltage and current measurement (0.5㎶ and 0.1fAresolution)
- Accurate and low-cost solutions to switch between multifrequency (1kHz to 5MHz) capacitance measuremet (CV,C-f and C-t) and current/coltage (IV) measurement. - Ultra-fast IV measurements with 100 ns pulsing and 5 ns sampling rate - Over 300 ready-to-use application tests - Curve tracer mode with oscilloscope view - Powerful data analysis and robust data menagement |
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| 구성 및 기능 |
- Range up to 100 V/0.1 A with 4-quadrant operation
- Minimum measurement resolution 1 fA/0.5 ㎶ - Optional ASU (atto-sense and switch unit) for 100 - aAresolution and IV/CV switching capability - Range up to 200 V/1 A with 4-quadrant operation - Minimum measurement resolution 10 fA/2 ⌷V - AC impedance measurement (C-V, C-f, C-t) - 1 kHz to 5 MHZ frequency range with minimum 1 mHz frequency resolution - 25 V built-in DC bias and 100 V DC bias with SMU and SCUU (SMU CMU Unify Unit) - Easy and fast yet accurate IV and CV automated connection change by SCUU - High voltage output up to ±40 V applicable for non-volatile memory testing - Two-level and three-level pulse capability by single channel - Flexible arbitrary waveform generation with 10 ns resolution (arbitrary linear waveform generation function) - Two channels per module - Ultra-fast IV measurement capability for the pulsed IV and transient IV such as NBTI/PBTI, RTN, etc. - Waveform generation with 10 ns programmable resolution - Simultaneous high-speed IV measurement capability (200MSa/s, 5 ns sampling rate) 10 V peak-to-peak output - No load line effect accurate plused IV measurement by dynamic SMU technology |
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